Electrical Engineer with 21 years of experience specializing in product and test engineering of complex silicon and gallium arsenide semiconductor devices. Strong team player with expertise in optoelectronic device reliability evaluations, automotive product qualifications, laser diodes (VCSELs), project management, test program development, yield improvements, packaging etc. Demonstrated ability to effectively perform under high pressure situations for crisis management and resolution of customer production stops. Highlights/Skills * In-depth knowledge of Wafer Acceptance Test (WAT) for VCSELs * Knowledge of HAST, PRM, MCO etc. for VCSELs * Detailed knowledge of optical data/parameters for VCSELs * Knowledge of Si and GaAs fab processes * Operations knowledge (assembly/test sites & wafer fabs) * Detailed knowledge of testers like Eagle, TL1S & VLCT * On-time resolution of customer issues and communication * Yield Improvement and Data Analysis (Cpk, GRR etc.) * Strong background in different types of packages/assembly materials * Cost reduction (tester change & test time reduction) * In-depth knowledge of Quality & Reliability tests for Si & GaAs chips * ATE Test Program Development & Debug Bench Tests * Root Cause Analysis & Failure Analysis * SAP, MS Office, UNIX, JMP * Detailed knowledge of CMS, PCN, MRB, CoDC, 8D, DFMEA & PPAP. * Six sigma & SPC methodologies * JEDEC, AEC-Q100, AEC-Q101 etc. * Knowledge of reliability stress tests (Autoclave, Temp Cycle, HTOL, ELFR, ESD, Latchup etc.) Accomplishments * Successful qualification & production ramp of 30+ automotive grade semiconductor devices (ICs) * Resolved 80+ customer production issues and provided on time resolutions * Conversion of 6 high volume parts to a different process technology in the Fab to fix oscillation issue reported by customers (revenue > $30 million/year) * Tester conversion of 30+ op-amps, comparators etc. in packaged & wafer form * Disposition of 1000+ VCSEL wafers based on WAT and HAST test data and results * Successful qualification & production ramp of 30+ automotive grade semiconductor devices (ICs) * Resolved 80+ customer production issues and provided on time resolutions * Conversion of 6 high volume parts to a different process technology in the Fab to fix oscillation issue reported by customers (revenue > $30 million/year) * Tester conversion of 30+ op-amps, comparators etc. in packaged & wafer form * Disposition of 1000+ VCSEL wafers based on WAT and HAST test data and results

Highlights:

• Reliability
• Automotive
• Management
• Packaging
• Product Management
• Project Management
• Project Manager
• Quality
• Test
• Test Specification