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research or analysis of semiconductor materials or engineering materials
SEM / FIB lab engineer strong in verifying and isolating semiconductor device failures and physical analysis to determine the root cause of failure. Proven experience in fault isolation, physical / construction analysis, identifying failure mechanisms, characterizing manufacturing defects and new semiconductor materials. Areas of expertise include: Failure Analysis FA Defect Characterization IC Failure Mechanisms SEM / FIB Lab Equipment Failure isolation technique Element Identification Semiconductor Processing Construction Analysis Patent Infringement Deprocess / delayer IC Semiconductor etches Chemistry
Laboratory
About Me
Industry: |
Research |
|---|---|
Occupation: |
Laboratory |
Ideal Companies: |
Lockheed-Martin, Honeywell, Intel, AMD, Freescale Semiconductor, US Government, Universities, ExxonMobile, Qualcom, Northrop Grumman, IBM, HP, General Dynamics, Loral Space Systems, Medtronic, Microchip |
Education level: |
Associate |
Will Relocate: |
Yes |
Location: |
Tempe, AZ |
Work Experiences
6/1984 - Present
(private)Individual Contributor
- • Identified poly stringers on Atlas Ultralight chip-set for automotive applications achieving a 30% yield improvement saving Freescale $100M in 1 year. The failure sites were pinpointed using PEM (Photo Emission Microscopy). • Improved SMOS8 lot yields 25% by discovering tungsten particles from wafer-edge arching causing metal shorts. The failures were isolated using XIVA (Externally Induced Voltage Alteration). • Enabled the MIM (Metal-Insulator-Metal) capacitor team to meet customer qualification date by determining the cause for short lifetime reliability samples were due to shorts from metal veils. Failures pinpointed with IR (Infrared Imaging). • Reduced equipment downtime 20% by troubleshooting malfunctions. Responsible for SEM / FIB (Scanning Electron Microscope / Focused Ion Beam) and sample preparation equipment maintenance, performance, and training. • Performed physical characterization using light microscopes, SEM, FIB, EDS / WDS (Energy / Wavelength Dispersive Spectroscopy), AES (Auger Electron Spectroscopy), and sample preparation equipment.
Education
1984
Associate Degree
San Joaquin Delta College
- Chemistry / Physics
1984
Certification Degree
San Joaquin Delta College
- Electron Microscopy
